Symbolic Analysis of Faulty Logic Circuits under Correlated Data - Dependent Gate Failures
نویسندگان
چکیده
In this paper we present a method for symbolic analysis of unreliable logic circuits in the presence of correlated and data-dependent gate failures, described by Markov chains. Furthermore, using this method we investigate the influence of data-dependent failures on the performance of majority logic and multiple input XOR gates.
منابع مشابه
A Fault Model and a Test Method for Analog Fuzzy Logic Circuits
A nalog circuit implementations of fuzzy logic are characterized by performing logical connectives of analog signals. They can be considered as generalization of digital circuits to a range of logical values, thus forming a special class of analog circuits. The idea of this work is to exploit this relationship for testing. For fault modeling the behavior of faulty fuzzy gates is investigated th...
متن کاملApplications of Fuzzy Program Graph in Symbolic Checking of Fuzzy Flip-Flops
All practical digital circuits are usually a mixture of combinational and sequential logic. Flip–flops are essential to sequential logic therefore fuzzy flip–flops are considered to be among the most essential topics of fuzzy digital circuit. The concept of fuzzy digital circuit is among the most interesting applications of fuzzy sets and logic due to the fact that if there has to be an ultimat...
متن کاملHigh-Speed Penternary Inverter Gate Using GNRFET
This paper introduces a new design of penternary inverter gate based on graphene nanoribbon field effect transistor (GNRFET). The penternary logic is one of Multiple-valued logic (MVL) circuits which are the best substitute for binary logic because of its low power-delay product (PDP) resulting from reduced complexity of interconnects and chip area. GNRFET is preferred over Si-MOSFET for circui...
متن کاملOptimization of Quantum Cellular Automata Circuits by Genetic Algorithm
Quantum cellular automata (QCA) enables performing arithmetic and logic operations at the molecular scale. This nanotechnology promises high device density, low power consumption and high computational power. Unlike the CMOS technology where the ON and OFF states of the transistors represent binary information, in QCA, data is represented by the charge configuration. The primary and basic devic...
متن کاملHybrid symbolic-genetic approach to test pattern generation for digital logic circuits
A genetic tests synthesis algorithm for the synchronous digital circuits, based on solving the problem of integer optimization with a scalar objective function is presented. A decomposition strategy of the circuit under test and symbolic representation of its fragments obtained. New objective function with global optimum which is the test sequence developed. Experimental results confirmed the e...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
عنوان ژورنال:
دوره شماره
صفحات -
تاریخ انتشار 2014